客服热线:0512-66076021
Regulating phase change behavior and surface characteristics of Sn15Sb85 thin film by oxygen doping
栏目:用户论文 发布时间:2020-04-15

Regulating phase change behavior and surface characteristics of Sn15Sb85 thin film by oxygen doping

摘要:

 

The resistance as a function of temperature (R–T) was measured using the in situ measurement with a heating rate of 10 °C min?1. The sample temperature was measured by a Pt-100 thermocouple located at a heating stage controlled by a TP 94 temperature controller (Linkam Scientific Instruments Ltd, Surrey, UK). The optical band gap was measured by NIR spectrophotometer. The phase structures of the films annealed at various temperatures were investigated by x-ray diffraction (XRD) analysis using Cu Ka radiation in the 2θ range from 20°to 60°, with a scanning step of 0.01°. The atomic force microscopy (AFM, FM-Nanoview 1000) was used to examine the surface topography.

编辑:

 

Yifeng Hu , Haipeng You, Qingqian Chou and Tianshu Lai

 

XML 地图 | Sitemap 地图
<em id="lwkspb905"><legend id="nizpvq315"></legend></em><th id="okfgib616"></th><font id="mehcsh730"></font>